Дата выпуска | Название | Автор(ы) |
1997 | A model of oxide layer growth on Ag+ and Pt+ ion implanted nickel anode in aqueous alkaline solution | Tashlykov, I. S. |
1999 | A simple theory and experimental investigation of ion-assisted deposition of cobalt coating on silicon | Carter, G.; Colligon, J.; Tashlykov, I. S. |
2015 | Analysis of composition, morphology and wettability of Mo thin layers deposited on glass | Tashlykov, I. S.; Mikhalkovich, Oleg; Zukowski, Pawel |
2007 | Analysis of the composition of Ti-based thin films deposited on silicon by means of self-ion assisted deposition | Tashlykov, I. S.; Zukowski, P. V.; Baraishuk, S. M.; Mikhalkovich, O. M. |
1980 | Backscattering measurements of P+ implanted GaAs crystals | Tashlykov, I. S. |
1986 | Change in structural properties of thin crystals of Si under electron irradiation | Komarov, F. F.; Tashlykov, I. S.; Korschunov, F. N.; Kamyshan, A. S.; Kotov, E. V.; Plaschinski, G. I. |
2015 | Composition and morphology of Ti and W coatings deposited on silicon during ion-beam assistance | Bobrovich, O. G.; Mikhalkovich, O. M.; Tashlykov, I. S. |
2009 | Composition and structure of Co films/Si substrate systems prepared by means of self-ion assisted deposition and accompanying silicon damage | Tashlykov, I. S.; Zukowski, P. V.; Mikhalkovich, O. M.; Ermakov, Yu. A.; Chernysh, V. S. |
2010 | Composition of Co films/Si substrate systems prepared by means of self-ion assisted deposition and accompanying silicon damage | Tashlykov, I. S.; Zhukowski, Pawel; Mikhalkovich, Oleg; Ermakov, Yuri; Chernysh, Vladimir |
2003 | Composition of thin C, Ti, Zr and Mo-based layers fabricated on Si by means of SIAD and accompanying radiation damage of Si surface | Tashlykov, I. S.; Wesch, W.; Wendler, E. |
1995 | Deposition of metal layers on carbon assisted with the same metal’s ion radiation | Tashlykov, I. S.; Bobrovich, O. G.; Palchekh, V. Ch.; Tuljev, V. V.; Alov, N. V.; Kulikauskas, V. S.; Wolf, G. K. |
1982 | Disorder dependence of ion implanted GaAs on the type of ion | Tashlykov, I. S. |
1986 | Effect of atomic mixing on the electrochemical and corrosion properties of Ni-Ti surfaces | Tashlykov, I. S.; Slesarenko, O. A.; Colligon, J. S.; Kheyrandish, H. |
1981 | Effect of ion implantation on the oxygen overpotential of Ni anodes | Akano, U.; Davies, J. A.; Smeltzer, W. W.; Tashlykov, I. S.; Thompson, D. A. |
2002 | Elastomer surface modification by means of SIAD of metal-based layers | Tashlykov, I. S.; Kasperovich, A. V.; Wolf, G. K. |
1999 | Elastomer treatment by arc metal deposition assisted with self-ion irradiation | Tashlykov, I. S.; Kasperovich, V. I.; Shadrukhin, M. G.; Kasperovich, A. V.; Wolf, G. K.; Wesch, W. |
2014 | Elemental composition, topography and wettability of PbxSn1-xS thin films | Tashlykov, I. S.; Turavets, A. I.; Gremenok, V. F.; Zhukowski, P. |
1997 | Evaluation of coatings produced by low-energy ion assisted deposition of co on silicon | Tashlykov, I. S.; Carter, G.; Colligon, J. S. |
1993 | Improvement of physical and chemical properties of steel implanted with Cr+, Ti+, Si+ ions | Tashlykov, I. S.; Belyi, I. M.; Bobrovich, O. G.; Tuljev, V. V.; Shadrukhin, M. G.; Kolotyrkin, V. I.; Tomashpolskii, M. Yu.; Kulikauskas, V. S. |
2013 | Morphology influence on water wettability of Mo back contact of solar cells | Turavets, A.; Tashlykov, I. S. |
1982 | Non-destructive quality control and microanalysis of ion-implanted solids | Tashlykov, I. S. |
1980 | Peculiarities of distribution of defects and introduced impurity in P+-implanted GaAs crystals | Komarov, F. F.; Tashlykov, I. S. |
2008 | Physical modification of filler of elastomer compositions | Berezun, E. V.; Kasperovich, A. V.; Tashlykov, I. S.; Shashok, Z. S.; Zukowski, P.; Koltunowicz, T.; Kolasik, M.; Kozak, C. |
1997 | Radiation damage and amorphization mechanisms in Xe+ irradiated CuInSe2 single crystals | Yakushev, M. V.; Tashlykov, I. S.; Tomlinson, R. D.; Hill, A. E.; Pilkington, R. D. |
2005 | Radiation damage of Si wafers modified by means of thin layer ion assisted deposition | Tashlykov, I. S.; Bobrovich, O. G. |
1995 | RBS depth profiling of metal coatings on elastomer | Kasperovich, A. V.; Kulikauskas, V. S.; Tashlykov, I. S.; Shadrukhin, M. G. |
2014 | Self ion assisted modification of elastomer and its micro- and macroscopic properties | Kasperovich, A.; Luhin, V.; Tashlykov, I. S.; Zhukowski, P. |
2013 | Surface morphological properties of Mo-based thin films on glass | Tashlykov, I. S.; Turavets, A.; Zhukowski, P. |
2014 | Surface properties of Me/Si structures prepared by means of self-ion assisted deposition | Tashlykov, I. S.; Zhukowski, P.; Mikhalkovich, O.; Baraishuk, S. |
2013 | The elemental composition, topography and wettability of Pb0.25Sn1.75S2 thin films | Tashlykov, I. S.; Turavets, A. I.; Gremenok, V. F.; Zhukowski, P. |
1984 | The influence of dose rate and analysis procedure on measured damage in P+ ion implanted GaAs | Carter, G.; Nobes, M. J.; Tashlykov, I. S. |
2013 | Сomposition of CuInSe2 crystals surface influenced by Xe+ ions irradiation | Tashlykov, I. S.; Silvanovich, D. A.; Gremenok, V. F. |