Dislocation scattering and charge transport in copper

dc.contributor.authorDem’yanov, S. E.
dc.contributor.authorSobol, V. R.
dc.contributor.authorDrozd, A. A.
dc.contributor.authorMatveev, V. N.
dc.date.accessioned2017-06-02T11:53:11Z
dc.date.available2017-06-02T11:53:11Z
dc.date.issued1986
dc.description.abstractGalvanomagnetic measurements have been carried out on plastically deformed single-crystal copper specimens. Effective small-angle scattering of the conduction electrons has been found. Point and extended defects, generated for small degrees of low-temperature plastic deformation, change the form of the magnetoresistance both for the open and closed electron trajectories. The scattering of electrons becomes predominantly isotropic for relatively large densities of deformation defects.ru_RU
dc.identifier.urihttp://elib.bspu.by/handle/doc/24921
dc.language.isoenru_RU
dc.publisherAmerican Institute of Physicsru_RU
dc.relation.ispartofseriesSov. J. Low Temp. Phys. 12(3), March 1986;pp. 179–181
dc.subjectБГПУru_RU
dc.subjectcopperru_RU
dc.subjectdislocation scatteringru_RU
dc.titleDislocation scattering and charge transport in copperru_RU
dc.typeArticleru_RU

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