The deformation scattering mechanism and conduction electron distribution function in aluminium

dc.contributor.authorGostishchev, V. I.
dc.contributor.authorDem’yanov, S. Ye.
dc.contributor.authorSobol, V. R.
dc.date.accessioned2017-06-02T11:21:28Z
dc.date.available2017-06-02T11:21:28Z
dc.date.issued1985
dc.description.abstractThe influence of low-temperature plastic deformation on the electrical resistivity and magnetoresistance of aluminium is studied experimentally. During deformation realized by multiple slip, anisotropy of the electronic distribut ion function is independent of dislocation density, but the magnetoresistance has a maximum, associated with effective electron scattering at small angles in long-range stress fields. Conduction electron scattering at point deformation defects essentially makes the distribution function isotropic, as seen in growth of the temperature dependent addition to resistivity and in decline of the relative transverse magnetoresistance in the temperature range 4·2-30 K.ru_RU
dc.identifier.urihttp://elib.bspu.by/handle/doc/24909
dc.language.isoenru_RU
dc.relation.ispartofseriesPhys. Met. Metall;vol. 60, No. 1, pp. 63–68
dc.subjectБГПУru_RU
dc.subjectaluminiumru_RU
dc.subjectelectrical resistivityru_RU
dc.subjectmagnetoresistanceru_RU
dc.subjectlow temperatureru_RU
dc.subjectplastic deformationru_RU
dc.titleThe deformation scattering mechanism and conduction electron distribution function in aluminiumru_RU
dc.typeArticleru_RU

Files

Original bundle

Now showing 1 - 1 of 1
Loading...
Thumbnail Image
Name:
14-Phys_Met_Metall-1985-60-1-СВР.pdf
Size:
587.09 KB
Format:
Adobe Portable Document Format

License bundle

Now showing 1 - 1 of 1
Loading...
Thumbnail Image
Name:
license.txt
Size:
197 B
Format:
Item-specific license agreed upon to submission
Description: